Rapid developments in satellite and sensor technologies have increased the availability of high-resolution, remotely sensed images faster than researchers can process and analyze the data manually.

Connected component labeling (CCL) is a fundamental operation within image processing and computer vision, serving as the backbone for tasks such as object recognition, segmentation, and analysis. At ...

Computer vision (CV) and image processing are two closely related fields that utilize techniques from artificial intelligence (AI) and pattern recognition to derive meaningful information from images, ...

Technology is continuously advancing and exponentially increasing the amount of data produced. Data comes from a multitude of sources and formats, requiring systems to process different algorithms.

Artificial intelligence (AI) domain controllers address the need to deal with the large volume of data from a variety of sensors and high-speed processing and security, adding a wealth of features and ...

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...